칩셋 221 - BQ27541

이 칩셋을 사용하는 모델 0건 (TB_TEST_MODEL)

MODEL_ID	모델명	팩유형	셀구성
등록된 모델이 없습니다.

쓰기(Write) 기본 항목 8건 (TB_WRITE_ITEM_BASIC)

ID	항목명
1	UNSEAL1
2	UNSEAL2
3	SEAL
4	DEVICE_NAME_YMD
5	PPID INFO
6	Enable System
7	Disable System
8	Cancel VDQ

검사 항목 82건 (TB_TEST_ITEM)

ID	항목명	단위	기본명령	복합명령	쓰기항목	쓰기데이터	변환식
75	PCMInfo_PCMDate(NBX)	—	Manual Test	—	—	—	—
11	Wake up	—	Manual Test	—	—	—	—
76	PCMInfo_PCMSN(NBX)	—	Manual Test	—	—	—	—
12	OCV1	—	Manual Test	—	—	—	—
77	System Present On	—	Manual Test	—	—	—	—
13	IR1	—	Manual Test	—	—	—	—
78	System Present Off	—	Manual Test	—	—	—	—
14	Unseal(835A)	—	Manual Test	—	—	—	—
79	Delay	—	Manual Test	—	—	—	—
15	Enable IT	—	Manual Test	—	—	—	—
16	Voltage accuracy	—	Manual Test	—	—	—	—
17	Battery Temperature	—	Manual Test	—	—	—	—
18	GG F/W Version Check	—	Manual Test	—	—	—	—
19	Check Cell Chemical ID	—	Manual Test	—	—	—	—
20	No Load Current	—	Manual Test	—	—	—	—
21	SAR	—	Manual Test	—	—	—	—
22	Rest	—	Manual Test	—	—	—	—
23	CCCV	—	Manual Test	—	—	—	—
24	DCCV	—	Manual Test	—	—	—	—
25	OCV2	—	Manual Test	—	—	—	—
26	IR2	—	Manual Test	—	—	—	—
27	RSOC	—	Manual Test	—	—	—	—
28	FCC (mAh)	—	Manual Test	—	—	—	—
29	Charge Current Accuracy	—	Manual Test	—	—	—	—
30	Discharge Current Accuracy	—	Manual Test	—	—	—	—
31	Cycle count	—	Manual Test	—	—	—	—
32	Write Barcode	—	Manual Test	—	—	—	—
33	Read Barcode	—	Manual Test	—	—	—	—
34	Pack Configuration (DF)	—	Manual Test	—	—	—	—
35	Read Serial Number	—	Manual Test	—	—	—	—
36	DFcompare	—	Manual Test	—	—	—	—
37	Set hibernate bit	—	Manual Test	—	—	—	—
38	Seal Pack and Verify	—	Manual Test	—	—	—	—
39	PCMInfo_PCMDate	—	Manual Test	—	—	—	—
40	PCMInfo_PCMSN	—	Manual Test	—	—	—	—
41	PackDate_W (from MES)	—	Manual Test	—	—	—	—
42	PackSN_W (from MES)	—	Manual Test	—	—	—	—
43	Check Device Name	—	Manual Test	—	—	—	—
44	Confirm_PackDate	—	Manual Test	—	—	—	—
45	Confirm_PackSN	—	Manual Test	—	—	—	—
46	Pack Manufacrure Date	—	Manual Test	—	—	—	—
47	Pack Serial Number	—	Manual Test	—	—	—	—
48	Pack configuration	—	Manual Test	—	—	—	—
49	DF_Safety	—	Manual Test	—	—	—	—
50	DF_Charge Inibit Cfg	—	Manual Test	—	—	—	—
51	DF_Charge	—	Manual Test	—	—	—	—
52	DF_Charge Termination	—	Manual Test	—	—	—	—
53	DF_Data_1	—	Manual Test	—	—	—	—
54	DF_Data_2	—	Manual Test	—	—	—	—
55	DF_Data_3	—	Manual Test	—	—	—	—
56	DF_Data_4	—	Manual Test	—	—	—	—
57	DF_Discharge	—	Manual Test	—	—	—	—
58	DF_ Manufacturer Data	—	Manual Test	—	—	—	—
59	DF_Lifetime Resolution	—	Manual Test	—	—	—	—
60	DF_Power_1	—	Manual Test	—	—	—	—
61	DF_Power_2	—	Manual Test	—	—	—	—
62	DF_IT Cfg_1	—	Manual Test	—	—	—	—
63	DF_IT Cfg_2	—	Manual Test	—	—	—	—
64	DF_IT Cfg_3	—	Manual Test	—	—	—	—
65	DF_IT Cfg_4	—	Manual Test	—	—	—	—
66	DF_IT Cfg_5	—	Manual Test	—	—	—	—
67	DF_IT Cfg_6	—	Manual Test	—	—	—	—
68	DF_Current Thresholds	—	Manual Test	—	—	—	—
69	DF_ State_1	—	Manual Test	—	—	—	—
70	DF_ State_2	—	Manual Test	—	—	—	—
71	Unseal_hermes	—	Manual Test	—	—	—	—
72	Check Charge Current	—	Manual Test	—	—	—	—
73	Check Discharge Current	—	Manual Test	—	—	—	—
74	DF_Min Taper Capacity	—	Manual Test	—	—	—	—
80	Unseal(NBX)	—	Manual Test	—	—	—	—
81	Set hibernate bit(Rocky)	—	Manual Test	—	—	—	—
82	Unseal(0414)	—	Manual Test	—	—	—	—
83	Voltage Deviation (MaxV - MinV)	—	Manual Test	—	—	—	—
84	Unseal(FFFF)	—	Manual Test	—	—	—	—
85	Reset	—	Manual Test	—	—	—	—
86	ADC Hidden DF	—	Manual Test	—	—	—	—
87	Fixed Hidden DF 1	—	Manual Test	—	—	—	—
88	Fixed Hidden DF 2-1	—	Manual Test	—	—	—	—
89	Fixed Hidden DF 2-2	—	Manual Test	—	—	—	—
90	Fixed Hidden DF 2-3	—	Manual Test	—	—	—	—
91	Fixed Hidden DF 2-4	—	Manual Test	—	—	—	—
92	Fixed Hidden DF 3	—	Manual Test	—	—	—	—

복합(조합) 명령 0건 (TB_UNION_CODE_MST / DTL)

등록된 복합 명령이 없습니다.

221 BQ27541

이 칩셋을 사용하는 모델 0건 (TB_TEST_MODEL)

쓰기(Write) 기본 항목 8건 (TB_WRITE_ITEM_BASIC)

검사 항목 82건 (TB_TEST_ITEM)

복합(조합) 명령 0건 (TB_UNION_CODE_MST / DTL)